000 01416cam a22003734a 4500
001 15310581
003 0
005 20170307121120.0
008 080530s2009 nyua b 001 0 eng d
010 _a 2008930122
020 _a9780387095783
040 _aIISER Bhopal
_cVBD
082 0 0 _a548.83 P332F2
_223
100 1 _aPecharsky, Vitalij K.
_9862
222 _aChemistry Collection
245 1 0 _aFundamentals of powder diffraction and structural characterization of materials
_cVitalij K. Pecharsky and Peter Y. Zavalij.
250 _a2nd ed.
260 _aNew York :
_bSpringer,
_c2009.
300 _axxiii, 741 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index.
650 0 _aPowders
_xOptical properties
_xMeasurement.
_9863
650 0 _aX-rays
_xDiffraction
_xMeasurement.
_9864
650 0 _aX-ray crystallography.
_9865
650 0 _aKristallstrukturanalyse.
_2swd
_9866
650 0 _aPulvermethode.
_2swd
_9867
650 0 _aRöntgenstrukturanalyse.
_2swd
_9868
650 0 _aChemistry.
_920799
700 1 _aZavalij, Peter Y.
_9869
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy1315/2008930122-d.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/enhancements/fy1315/2008930122-t.html
906 _a7
_bcbc
_ccopycat
_d2
_encip
_f20
_gy-gencatlg
942 _2ddc
_cBK
999 _c6101
_d6101