000 | 01416cam a22003734a 4500 | ||
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001 | 15310581 | ||
003 | 0 | ||
005 | 20170307121120.0 | ||
008 | 080530s2009 nyua b 001 0 eng d | ||
010 | _a 2008930122 | ||
020 | _a9780387095783 | ||
040 |
_aIISER Bhopal _cVBD |
||
082 | 0 | 0 |
_a548.83 P332F2 _223 |
100 | 1 |
_aPecharsky, Vitalij K. _9862 |
|
222 | _aChemistry Collection | ||
245 | 1 | 0 |
_aFundamentals of powder diffraction and structural characterization of materials _cVitalij K. Pecharsky and Peter Y. Zavalij. |
250 | _a2nd ed. | ||
260 |
_aNew York : _bSpringer, _c2009. |
||
300 |
_axxiii, 741 p. : _bill. ; _c24 cm. |
||
504 | _aIncludes bibliographical references and index. | ||
650 | 0 |
_aPowders _xOptical properties _xMeasurement. _9863 |
|
650 | 0 |
_aX-rays _xDiffraction _xMeasurement. _9864 |
|
650 | 0 |
_aX-ray crystallography. _9865 |
|
650 | 0 |
_aKristallstrukturanalyse. _2swd _9866 |
|
650 | 0 |
_aPulvermethode. _2swd _9867 |
|
650 | 0 |
_aRöntgenstrukturanalyse. _2swd _9868 |
|
650 | 0 |
_aChemistry. _920799 |
|
700 | 1 |
_aZavalij, Peter Y. _9869 |
|
856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy1315/2008930122-d.html |
856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy1315/2008930122-t.html |
906 |
_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg |
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942 |
_2ddc _cBK |
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999 |
_c6101 _d6101 |