TY  - BOOK
AU  - Pecharsky,Vitalij K.
AU  - Zavalij,Peter Y.
TI  - Fundamentals of powder diffraction and structural characterization of materials 
SN  - 9780387095783
U1  - 548.83 P332F2 23
PY  - 2009///
CY  - New York
PB  - Springer
KW  - Powders
KW  - Optical properties
KW  - Measurement
KW  - X-rays
KW  - Diffraction
KW  - X-ray crystallography
KW  - Kristallstrukturanalyse
KW  - swd
KW  - Pulvermethode
KW  - Röntgenstrukturanalyse
KW  - Chemistry
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy1315/2008930122-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy1315/2008930122-t.html
ER  -