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Digital systems testing and testable design Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
Material type:
TextSeries: Electrical engineering communications and signal processing seriesPublication details: Mumbai : Jaico Publishing House, 2013.Description: xviii, 652 p. : ill. ; 25 cmISBN: - 8172248911 (Pbk)
- 9788172248918
- 621.3815 D569 23
- TK7874 .A23 1990
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
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Books
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Central Library, IISER Bhopal Reference Section | Reference | 621.3815 D569 (Browse shelf(Opens below)) | Not For Loan | Reserve | 9066 | ||
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Books
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Central Library, IISER Bhopal General Section | 621.3815 D569 (Browse shelf(Opens below)) | Available | 9067 |
Browsing Central Library, IISER Bhopal shelves, Shelving location: Reference Section, Collection: Reference Close shelf browser (Hides shelf browser)
| 621.3815 C457L3 Linear integrated circuits | 621.3815 C457L4 Linear Integrated circuits | 621.3815 C457L4 Linear Integrated circuits | 621.3815 D569 Digital systems testing and testable design | 621.3815 L972N Near-equilibrium transport : | 621.3815 L972N Nanoscale transistors : | 621.3815 P34P Power aware design methodologies |
Includes bibliographical references (p. 644-645) and index.
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