Fundamentals of powder diffraction and structural characterization of materials Vitalij K. Pecharsky and Peter Y. Zavalij.
Publication details: New York : Springer, 2009.Edition: 2nd edDescription: xxiii, 741 p. : ill. ; 24 cmISBN:- 9780387095783
- 548.83 P332F2 23
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Central Library, IISER Bhopal Reference Section | Reference | 548.83 P332F2 (Browse shelf(Opens below)) | 1 | Not For Loan | Reserve | 0672 | ||
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Central Library, IISER Bhopal General Section | 548.83 P332F2 (Browse shelf(Opens below)) | 2 | Available | 5997 |
Browsing Central Library, IISER Bhopal shelves, Shelving location: General Section Close shelf browser (Hides shelf browser)
| 548.8 K295C2 Crystallography and Crystal Defects | 548.83 N579N Neutron Protein Crystallography : | 548.83 OO1P Principles of x-ray crystallography | 548.83 P332F2 Fundamentals of powder diffraction and structural characterization of materials | 548.83 P879 P.P. Ewald and his Dynamical Theory of X-ray Diffraction : | 548.83 R446 The Rietveld method | 548.842 W419E Elementary dislocation theory |
Includes bibliographical references and index.
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