Analysis, Mitigation of Leakage Mechanisms in Planar MOS Devices and Incorporation of Performance Improvement Methodologies

Kansal, Harshit; Supervisor- Dr. Varadharajan Srinivasan

Analysis, Mitigation of Leakage Mechanisms in Planar MOS Devices and Incorporation of Performance Improvement Methodologies - Bhopal: Department of Electrical Engineering and Computer Science, Indian Institute of Science Education and Research, 2022. - xxviii,130



Contact for Queries: skpathak@iiserb.ac.in